Publications & Research
Explore our contributions to top journals and conferences in nano-electronics, AI/ML, and semiconductor design.
Access & Copyright
IEEE holds the copyright for papers published in IEEE journals and conferences. Papers are accessible through the IEEE Xplore Digital Library.
Conference Papers
STT-CMOS Hybrid Designs for Reverse-engineering Prevention
T. Winograd, H. Salmani, H. Mahmoodi, H. Homayoun
IEEE Design Automation Conference — Jun 2016
Comparative Analysis of Robustness of Spin Transfer Torque based Look up Tables under Process Variations
R. Kuttappa, H. Homayoun, H. Salmani, H. Mahmoodi
IEEE International Symposium on Circuits and Systems — May 2016
Preventing Design Reverse Engineering with Reconfigurable Spin Transfer Torque LUT Gates
T. Winograd, H. Salmani, H. Mahmoodi, H. Homayoun
IEEE International Symposium on Quality Electronics Design — Mar 2016
Journal Papers
Reliability Analysis of Spin Transfer Torque based Look up Tables under Process Variations and NBTI Aging
R. Kuttappa, H. Homayoun, H. Salmani, H. Mahmoodi
Elsevier Microelectronics Reliability Journal — Mar 2016
Robust FinFET SRAM Design based on Dynamic Back-Gate Voltage Adjustment
B. Ebrahimi, A. Afzali-Kusha, H. Mahmoodi
Elsevier Microelectronics Reliability Journal, vol. 54, no. 11 — Nov 2014